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Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties and Superconductor Critical-Current Testing

Name: Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties and Superconductor Critical-Current Testing
Price: 47461.00 JPY
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Product ID: 381753780

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Frequently Bought Together

Experimental Techniques: Cryostat Design, Material Properties and Superconductor Critical-Current Testing

Matter and Methods at Low Temperatures

Introduction to Superconductivity: Second Edition (Dover Books on Physics)

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Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties and Superconductor Critical-Current Testing

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